Mettler Toledo Product Inspection, the global leader in product inspection devices, software and service, will hold its 2019 Exchange event on November 13-15. This year’s event will focus on ensuring product safety in food production operations and will feature speakers from the industry addressing significant topics of current concern. The event will also include a tour of the extensive Mettler Toledo facility in Lutz, including a product fair and demonstrations in the facility’s Applications Center.
The title of the 2019 event is “The Exchange: Where Experts Meet to Exchange the Latest Advances to Ensure Safety and Compliance in Food Production.” Keynote speakers will include Gary Flickinger, Sr. VP of Operations and Supply at Green Thumb Industries, who will address IIoT, Industry 4.0 and related topics, and Robert Campion, Director of Packaging at Nestle, who will discuss how to avoid and manage recalls and hot topics in packaging.
Standards owners from BRC, IFS, FSSC22000 and the SQF Institute as well as consultants from Kestrel Management Services, P&G and Savour Food Safety International will address topics such as certification, validation, compliance, and the future of technology in the industry.
The Exchange will end with a panel discussion of how food safety will be viewed in 2025, and how it will affect the industry and its members.
About METTLER TOLEDO Product Inspection
METTLER TOLEDO Product Inspection is a division of METTLER TOLEDO, Inc., a global supplier of precision instruments with sales and service locations in 39 countries. The METTLER TOLEDO Product Inspection Group, consisting of CI-Vision, Hi-Speed and Safeline, is the world’s leading supplier of machine vision systems, in-line checkweighers, metal detectors, and x-ray inspection systems. These systems are used in many industries, including food, beverage, pharmaceutical, nutraceutical, personal care, plastics and chemicals to continuously ensure the quality of their products and improve the efficiency of their manufacturing and packaging processes.